Authors - AES

New Measurements for High Fidelity Components

Authors: Feldman, Leonard

Affiliation: Leonard Feldman Electronic Laboratories, Great Neck, NY

Publication Date: September 1973

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

Authors: Feldman, Leonard

Publication Date: May 1989

Type: Conference Paper

Cost: Free to AES members & institutions and $33 to non-members

Authors: Halstead, William S.; Feldman, Leonard

Affiliation: RTV International, Inc., and Multiplex Development Corp., New York, NY ; Audio Engineering Consultant, Great Neck, NY

Publication Date: December 1970

Type: Journal Article

Cost: Free to AES members & institutions and $33 to non-members