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Author

Contactless Flaw Detection Based on the Doppler Effect

Authors: Cherek, B.; Armannson, J. H.; Delsanto, P. P.
Affiliation: Aalborg University, Aalborg, Denmark ; Politechnico di Torino, Torino, Italy
Publication Date: March 1989
Type: Convention Paper
Cost: Free to AES members & institutions and $33 to non-members