AES Dublin 2019
Workshop W01
Wednesday, March 20, 09:15 — 10:45 (Liffey Hall 1)
W01 - Loudspeaker Reliability Test Signals
Chair:Steven Hutt, Equity Sound Investments - Bloomington, IN, USA
Panelists:
Laurie Fincham, THX LTD - San Francisco, CA, USA
Wolfgang Klippel, Klippel GmbH - Dresden, Germany
Philip Knight, Phil Knight Associates - Hook, Hampshire, UK
Richard Little, Goertek Electronics Inc. - Santa Clara, CA, USA
Roger Schwenke, Meyer Sound Laboratories - Berkeley, CA, USA
Test Signals used for loudspeaker system reliability testing utilize tailored attributes such as band width, duty cycle, and crest factor to evaluate input capacity for loudspeaker systems. While noise can be shaped to emulate music's spectrum and crest factor, music has correlated time/frequency event cycles that impose different thermal and mechanical stress on a loudspeaker. Panelists will discuss correlation of music signals to different test signals as specified in AES and IEC standards or alternatives and comment on how anticipated duress of a loudspeaker system in the field affects useful life.
 | This session is presented in association with the AES Technical Committee on Loudspeakers and Headphones |