AES Paris 2016
Professional Sound Expo Session

Sunday, June 5, 15:00 — 15:45 (PSE Stage)

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Measurement Uncertainty in Audio Testing

Presenter:
Bruce Hofer, Audio Precision, Inc. - Beaverton, Oregon, USA

Abstract:
All measurements are subject to some degree of uncertainty including such factors as readout resolution, short term stability and temperature effects, and estimates of error with regard to national standards. Reported measurement results should also contain an estimate of their respective uncertainties so that comparisons can be meaningful. In the world of metrology, this process of reporting measurement uncertainty is very strict requiring either some knowledge about the distributions of the various factors and the concept of standard deviation. This session will briefly discuss some of the uncertainty factors that can affect traditional audio measurements.


Return to Professional Sound Expo Sessions

EXHIBITION HOURS June 5th   10:00 – 18:00 June 6th   09:00 – 18:00 June 7th   09:00 – 16:00
REGISTRATION DESK June 4th   08:00 – 18:00 June 5th   08:00 – 18:00 June 6th   08:00 – 18:00 June 7th   08:00 – 16:00
TECHNICAL PROGRAM June 4th   09:00 – 18:30 June 5th   08:30 – 18:00 June 6th   08:30 – 18:00 June 7th   08:45 – 16:00
AES - Audio Engineering Society